Ключевые слова: presentation, HTS, REBCO, coated conductors, doping, fabrication, IBAD process, PLD process, high rate process, doping, coils pancake, current-voltage characteristics, uniformity, Jc/B curves, angular dependence, critical current, magnetic field dependence, mechanical properties, thickness dependence, fatigue behavior, stress effects, strain effects
Ключевые слова: presentation, HTS, REBCO, coated conductors, fabrication, IBAD process, PLD process, status, critical caracteristics, critical current, magnetic field dependence, angular dependence, mechanical properties, tensile tests, strain effects, stress effects, bending process, compression, delamination, magnets sextupole, conduction cooled systems, coils pancake, test results
Iijima Y., Kiss T., Iwakuma M., Sato H., Fujita S., Igarashi M., Hanyu S., Naoe K., Kurihara C., Nakamura N., Daibo M., Muto S., Hirata W.
Iijima Y., Kakimoto K., Fujita S., Itoh M., Igarashi M., Hanyu S., Adachi Y., Nakamura N., Kikutake R., Daibo M., Nagata M., Ohsugi M., Tateno F.
Iijima Y., Fuji H., Kakimoto K., Sutoh Y., Fujita S., Itoh M., Igarashi M., Hanyu S., Tobita H., Nakamura N., Kikutake R., Daibo M., Nagata M.
Iijima Y., Saitoh T., Fuji H., Kakimoto K., Sutoh Y., Itoh M., Igarashi M., Hanyu S., Kutami H., Kikutake R., Daibo M., Suzuki R.
Iijima Y., Saitoh T., Kakimoto K., Sutoh Y., Igarashi M., Hanyu S., Hanada Y., Kutami H., Hayashida T., Nakamura N., Takemoto T., Kikutake R.
Iijima Y., Saitoh T., Kakimoto K., Sutoh Y., Igarashi M., Hanyu S., Hanada Y., Kutami H., Hayashida T., Tashita C., Morita K.
Iijima Y., Saitoh T., Kakimoto K., Sutoh Y., Igarashi M., Hanyu S., Hanada Y., Kutami H., Hayashida T., Tashita C., Morita K.
Ключевые слова: HTS, coated conductors, long conductors, high rate process, REBCO, IBAD process, PLD process, substrate Ni alloy, fabrication, texture, critical current distribution, length
Iijima Y., Saitoh T., Kakimoto K., Sutoh Y., Fujita S., Igarashi M., Hanyu S., Hanada Y., Kutami H., Hayashida T., Tashita C., Morita K., Nakamura N.
Iijima Y., Saitoh T., Kakimoto K., Sutoh Y., Igarashi M., Hanyu S., Hanada Y., Kutami H., Hayashida T., Tashita C., Morita K., Nakamura N.
Ключевые слова: HTS, REBCO, coated conductors, IBAD process, buffer layers, texture, microstructure, fabrication, length
Iijima Y., Saitoh T., Kakimoto K., Sutoh Y., Fujita S., Igarashi M., Hanyu S., Hanada Y., Kutami H., Hayashida T., Morita K., Nakamura N.
Iijima Y., Saitoh T., Kakimoto K., Sutoh Y., Igarashi M., Hanyu S., Hanada Y., Kutami H., Hayashida T., Tashita C., Morita K.
Ключевые слова: HTS, REBCO, IBAD process, high rate process, fabrication, long conductors, texture, critical caracteristics, critical current, length
Iijima Y., Saitoh T., Fuji H., Kakimoto K., Igarashi M., Hanyu S., Hanada Y., Kutami H., Hayashida T., Tashita C.
Iijima Y., Saitoh T., Fuji H., Kakimoto K., Igarashi M., Hanyu S., Hanada Y., Kutami H., Hayashida T., Tashita C.
Iijima Y., Saitoh T., Fuji H., Kakimoto K., Igarashi M., Hanyu S., Hanada Y., Kutami H., Hayashida T., Tashita C.
Ключевые слова: HTS, REBCO, coated conductors, IBAD process, fabrication, buffer layers, high rate process, microstructure
Iijima Y., Saitoh T., Fuji H., Kakimoto K., Igarashi M., Hanyu S., Hanada Y., Kutami H., Hayashida T., Tashita C.
Iijima Y., Saitoh T., Fuji H., Kakimoto K., Kato T., Hirayama T., Igarashi M., Hanyu S., Hanada Y., Miura T.
Ключевые слова: HTS, REBCO, coated conductors, IBAD process, PLD process, long conductors, template layers, fabrication, critical current density, critical caracteristics, length
Iijima Y., Saitoh T., Fuji H., Kakimoto K., Kato T., Hirayama T., Igarashi M., Hanyu S., Hanada Y., Miura T.
Ключевые слова: HTS, REBCO, coated conductors, buffer layers, IBAD process, texture, microstructure, fabrication
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